Single-crystal and powder X-ray diffraction (XRD), X-ray fluorescence (XRF)
The X-Ray Core Facility provides sample analysis via single-crystal X-ray diffraction (SCXRD), powder X-ray diffraction (PXRD) and X-ray fluorescence (XRF). The three techniques can be complementary and are routinely used by materials scientists, chemists, physicists, geologists and engineers. The facility currently houses two single-crystal X-ray diffractometers, two powder X-ray diffractometers and one X-ray fluorescence spectrometer.
Single-crystal X-ray diffraction, powder X-ray diffraction, X-ray fluorescence
- Chemical industries
- Clean technology
- Life sciences, pharmaceuticals and medical equipment
- Manufacturing and processing
Specialized labs and equipment
|Bruker KAPPA APEX II single-crystal X-ray diffractometer
|A four-circle KAPPA goniometer with the APEX II CCD detector. The X-ray source is a molybdenum fine-focus sealed tube combined with a TRIUMPH monochromator that delivers more than three times higher intensity at the sample than previous generations of monochromators
|Bruker SMART APEX II single-crystal X-ray diffractometer
|A three-circle goniometer with the APEX II CCD detector. The X-ray source is a molybdenum fine-focus sealed tube combined with a MONOCAP focusing collimator for increased intensity.
|Philips PW3020 X’Pert powder diffractometer
|A general-purpose theta/2theta system with twin goniometers and a single long fine-focus X-ray tube with a copper anode. One goniometer is dedicated to standard diffraction measurements, while the other is used to study phase transitions of samples by coupling with Anton Parr low- (~80 to 575 K) or high- (up to 1300°C) temperature cameras.
|Rigaku Ultima IV powder diffractometer
|A general-purpose theta/theta system with a copper source and a diffracted beam monochromator that can be used with either focused-beam or parallel-beam geometries; configured for use of either fixed or variable slit widths, the latter facilitating data measurement at low angles. A small-angle X-ray scattering (SAXS) attachment is used to determine particle/pore size of a nanomaterial (1nm-100nm) in transmission mode. A micro area stage and microscope allow for x-y mapping of a sample by scanning various x-y positions with very small beam sizes using a specially designed selection slit.
|Supermini200 high-power sequential wavelength dispersive X-ray fluorescence spectrometer
|The spectrometer provides elemental analysis of oxygen (O) through uranium (U). X-ray fluorescence is supported by a sample-preparation lab with a Claisse fluxer for fused discs and a Carver press for pressed pellets.