Scanning probe microscopy with advanced capabilities, and advanced materials optical microscopy with spectroscopic capabilities
Materials science characterization using ultraviolet to near infrared spectroscopies and microscopy techniques, fluorescence microscopy and spectroscopy techniques, as well as atomic force microscopy equipped for variable temperature measurements and electrochemical measurements.
Analyses include materials for topography, local variations in conductivity, temperature-dependent phase changes, and various spectroscopies of materials.
- Aerospace and satellites
- Arts and cultural industries
- Automotive
- Chemical industries
- Clean technology
- Construction (including building, civil engineering, specialty trades)
- Consumer durables
- Defence and security industries
- Education
- Energy
- Environmental technologies and related services
- Forestry and forest-based industries
- Information and communication technologies and media
- Life sciences, pharmaceuticals and medical equipment
- Manufacturing and processing
- Mining, minerals and metals
- Transportation
Specialized labs and equipment
|
Specialized lab |
Equipment |
Function |
|---|---|---|
|
Scanning probe microscopy |
Atomic force microscope |
Topography scans, lateral force measurements, temperature-dependent phase changes, localized electrochemical measurements, adhesion force measurements, tapping mode, contact mode, coupled with optical imaging of samples, scanning capacitance measurements, and variable magnetic field measurements |
|
Optical microscopy and spectroscopy |
Optical microscope coupled with a spectrometer |
Reflectance, transmittance imaging modes, fluorescence microscopy, DIC, DF, BF, polarized microscopy, UV-Vis-NIR spectroscopy in reflectance mode, z-stack based imaging, integration of images into large area composite image, as well as particle and grain boundary analysis |
Additional information
|
Title |
URL |
|---|---|
|
Gates Research Group |
|
|
4D Labs at SFU |