Analysis of thin films using scanning probe microscopy techniques with advanced capabilities and dielectric analysis of single nanoparticles.
Advanced materials science characterization to assess material uniformity, corrosion resistance, and properties of nanoscale materials and structures, including thin films. Property measurements include optical characterization of dielectric-dependent responses (spectroscopy), magnetic properties, and electrochemical behaviour and stability. Select measurements can be performed over a range of temperatures.
A view into the nanoscale architecture of materials and coatings. The techniques and expertise available lend themselves to tackling a variety of materials science challenges related to the study of interfaces and the stability of the materials at these interfaces.
- Clean technology
- Defence and security industries
- Education
- Manufacturing and processing
- Mining, minerals and metals
Specialized labs and equipment
- Nanoparticle analysis: optical characterization of nanoparticle properties (including dielectric dependent light scattering), optical mapping of particle locations on planar substrates using light scattering or scanning probe techniques, and magnetic properties under a variable applied field.
- Thin film analysis: Optical mapping of reflective properties, light scattering analysis, assessment of height variations, visible spectroscopy, mapping of magnetic properties, mapping of compositional variations (work function mapping, not elemental analysis).